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Active
wafer-level optimization of precision linear and mixed-signal
IC devices
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Provides active trim through integration of laser micro-machining,
probing, & test |
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Superior
laser control ensures process consistency & highest
yields
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Precise
wafer alignment and trim accuracy via Cognex® pattern
recognition
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Seamless
integration to todays ATEs via Enhanced Tester Interface |
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Reliable,
field-proven product: 100s are in daily production worldwide
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